A practical guide to wavelets for metrology.
G J Lord, Eulogio Pardo‐Igúzquiza, I. M. Smith · OpenGrey (Institut de l'Information Scientifique et Technique) · 2000
This report aims to give a brief introduction to wavelet analysis and to identify its relevance to areas of metrology. Wavelets provide an economical basis for a wide range of applications as well as offering simultaneously a time and frequency analysis of a signal. Wavelets should not be viewed as a stand-alone tool but as a complementing and supplementing well established techniques.