A Test Suit Reduction Method Based on Defect Detecting Capabilit
Zhe Sun, Tian Zhang, Yanhong Peng, Linbo Wu, Yunqiang Yan, Yi Zhang · 2019 IEEE 2nd International Conference on Automation, Electronics and Electrical Engineering (AUTEEE) · 2019
The scale of test cases and the ability to detect defects determine the cost and effectiveness of software testing. A well-designed test suit reduction method should maximize the effectiveness of defect detection while reducing the cost of software testing. In this paper, a test suit reduction method based on defect detection capability is presented. The scale of the test cases to be selected and their defect detection capability are fully considered in the reduction process. The example application shows that compared with the traditional single-objective heuristic algorithm, the test case reduction set obtained by this method has improved in scale and defect detection ability.