Characterization of Locked Combinational Circuits via ATPG
Danielle Duvalsaint, Xiaoxiao Jin, Benjamin Niewenhuis, Ronald DeShawn Blanton · 2019
Threats to integrated circuits exist due to the outsourcing of IC design and fabrication to third parties. As a result, various design-for-trust techniques have been developed including logic locking. Current methods of characterizing the security of logic locking require multiple tools and expertise for the various locking types now in existence. In this paper, we propose an ATPG-based toolbox called CLIC-A (Characterization of Locked Integrated Circuits via ATPG) that can be used to determine the level of security effectiveness for a given instance of a locked circuit. Experiments demonstrate that CLIC-A is effective across a multitude of locking methods.