A Pattern Comparison Algorithm for Pruning Fault Candidates
Hyung-Jun Cho, Sungho Kang · Journal of the Institute of Electronics Engineers of Korea · 2007
In this paper, we present a pattern comparison algorithm for reducing fault candidate lists. The number of fault candidates determines the total fault simulation time. To decrease the total fault diagnosis time, the reduction of the number of fault candidates is essential. Critical path tracing determines fault candidate lists detected by a set of tests using a backtracing algorithm starting at the primary outputs of a circuit. The proposed algorithm reduces fault candidates comparing failing patterns with good patterns during critical path tracing process. As we reduce all fault candidates of the circuit to more accurately suspected fault candidates, we can greatly reduce fault simulation time. The proposed algorithm greatly increases simulation speed than that of a conventional backtracing method. The proposed algorithm is applicable to both combinational and sequential circuits. Experimental results on ISCAS#85 and ISCAS#89 benchmark circuits showed fault candidates are pruned and fault diagnosis time is also decreased in proportion to fault candidate decrease.