INL and DNL Estimation Based on Noise for ADC Test
M. G. C. Flores, Marcelo Negreiros, Luigi Carro, Altamiro Susin · IEEE Transactions on Instrumentation and Measurement · 2004
This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.