On the issues of oscillation test methodology
M.W.T. Wong · IEEE Transactions on Instrumentation and Measurement · 2000
In recent years, advances in integration fabrication technologies prompted IC designers to move more analog circuitry onto what had been entirely digital chips, making the verification problem for the entire chip more difficult. This paper presents a detailed case study of using the oscillation test methodology to test an active low pass filter. We highlight some of the difficulties and shortcomings of this testing approach.