Measuring mixed signal substrate coupling
Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Marc van Heijningen · 2002
A measurement method is proposed to characterise the substrate coupling between digital and analog sections of a mixed signal CMOS chip. Induced noise and spurious signals are measured by a custom designed analog sensor. Calibrated sampling scope based measurements show the strength and drawbacks of the proposed approach.