A Framework for Localizing Aging-Related Bugs in a Random and Dynamic Way
Xiao–Yi Zhang, Junjun Zheng · 2019
This paper proposes a basic framework for localizing aging-related bugs, by adapting their general characteristics in a dynamic and random way. Specifically, the term "test profile" is introduced and modeled as a Discrete-Time Markov Chain (DTMC). It is used to generate test cases as a long sequence of component transitions. During the process of testing, we gradually adjust the test profile such that the phenomenon of aging can be approximated. Finally, through the exploration of the relationship between test profile and program components, the fault proneness of each component is calculated. Numerical simulation shows that our framework provides a promising way to localize bugs with accumulative effects.