A Comprehensive Approach to a Trusted Test Infrastructure
Marc Merandat, Vincent Reynaud, Emanuele Valea, J. Quévremont, Nicolas Valette, Paolo Maistri, R. Leveugle, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre, Giorgio Di Natale · 2019
The testability of electronic devices is of critical importance and it is often supported by IEEE standards. The available methods, on the other hand, can be an entry point to a malicious attacker, if no proper countermeasure is adopted. In this paper, we report the latest results from the HADES project, presenting a portfolio of solution towards a secure test infrastructure.