Broadside Tests for Transition and Stuck-At Faults
Irith Pomeranz · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2019
A recent work showed that it is possible to transform a single-cycle test for stuck-at faults into a skewed-load test that detects the same stuck-at faults without performing logic or fault simulation. By using this transformation, it is possible to generate a compact skewed-load test set for stuck-at and transition faults. The advantage for test compaction is related to the fact that the test set contains a single test type. For cases where broadside tests are preferred over skewed-load tests, this article studies the possibility of transforming a single-cycle test into a broadside test, and generating a compact broadside test set for stuck-at and transition faults. This article addresses several challenges in order to achieve this goal without resorting to sequential test generation or state justification that have a high computational complexity. The experimental results for benchmark circuits demonstrate the levels of test compaction that can be achieved using small numbers of observation points.