Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect
Vaishali Dhare, Usha Sandeep Mehta · 2019
Quantum-dot-Cellular Automata (QCA) is emerging as one of the alternatives for Integrated Circuit Technology considering the scaling limitations of current Complementary Metal Oxide Semiconductor (CMOS) technology. Being at molecular scale, defects are more likely to occur in QCA devices. Therefore, substantial development of QCA oriented defects, its corresponding fault models and test generation is required. This paper addresses the test generation of QCA combinational circuits targeting the fault models caused by Multiple Missing Cells (MMC) defect. Even though, there are many advanced Automatic Test Pattern Generators (ATPGs) available for CMOS technology, to demonstrate MV (Majority Voter) based circuits with reference to test pattern generation process, the extension of basic ATPG is proposed here. The proposed test generation algorithm is guided by the extended Sandia Controllability Observability Analysis Program (SCOAP) testability measures especially for QCA logic primitives. The proposed ATPG is tested on MCNC benchmark circuit set.