Analysis of Estimation Errors of the Fifth and Sixth Order Cumulants
Александр Иванович Красильников, Виктор Сергеевич Берегун, Oksana Harmash · 2019
The following topics are dealt with: silicon; nanofabrication; elemental semiconductors; nanoparticles; nanostructured materials; X-ray diffraction; medical image processing; nanoelectronics; III-V semiconductors; diseases.