Configurable MBIST Processor for Embedded Memories Testing
Andrzej A. Wojciechowski, Krzysztof Marcinek, Witold Adam Pleskacz · 2019
Nowadays, demand for computing power grows faster than ever. This results in more integrated circuits are being dedicated to memories. The efficient testing of such SRAM memories is a difficult task. An integrated Memory Built-In Self-Test (MBIST) module provides an effective testing capability with reasonable area cost. This paper describes the design of a configurable MBIST processor for embedded single-port and dual-port memories testing. Embedded memory fault models were summarized. The developed test environment with memory model and fault injection capability was used to verify the effectiveness of the implemented algorithms.