A System for FPGA Aging Test
Zong Jie Xiang, Wei Liu, Li heng Wang, Lan Lai Wang · 2018
This paper proposes an aging test system. Aging test is a general procedure in the phase of device design and manufacturing. The proposed aging test system is designed for Xilinx FPGA. It can test up to nigh FPGAs at the same time. The main advantages of our system over existing systems lie in its capabilities of capturing FPGA's internal temperature and automatic monitoring the test results. The system achieves these capabilities by including a portable automatic test equipment we designed previously as a part. The power system of our system is also well designed when comparing with the existing systems. Our proposed system is currently placed in service and demonstrates the high reliability.