A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register (MISR)
Afaq Ahmad · International Journal of VLSI Design & Communication Systems · 2010
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Input Shift Register), used in an LFSR based digital circuit testing technique.The investigation is carried-out through an extensive simulation study of the effectiveness of the LFSR based digital circuit testing technique.The results of the study show that when the identical characteristic polynomials of order n are used in both pseudo-random test-pattern generator, as well as in Multi-Input Shift Register (MISR) signature analyzer (parallel type) then the probability of aliasing errors remains unchanged due to the changes in the initial loadings of the pseudo-random test-pattern generator.