FPGA implementation of the portable automatic testing system for digital circuits
Mohamed H. El-Mahlawy, Ahmed Abd El-Wahab, Al-Emam Ragab · The International Conference on Electrical Engineering/The International Conference on Electrical Engineering · 2008
The authors in paper [1] are presented the new automatic test equipment (ATE) fordigital integrated circuits based on the signature analysis. This work introduced acomplete framework for the testing of the printed circuit boards (PCBs) of the digitalintegrated circuits. In this paper, the Field Programmable Gate Array (FPGA)implementation of this new ATE is presented. The timing simulation and then designdownload are presented on the Spartan Xilinx chip (X2S400EFT256-7). In this paper,the concept of the portable ATE is presented that reduces the complexity of thetraditional ATE. This compacted testing system approach is designed to apply the testpattern to the circuit under test (CUT) and to compact the response of the CUT bysignature analyzer. The timing controller and the parallel port of the personal computer(PC) generate all required signals to control all steps of the test cycle for properoperation.