Innovative Practices on Automotive Test
Wim Dobbelaere, Marco Restifo, Peter Sarson · 2019
In this IP session, there will be 2 presentations focusing on how to increase the in-field quality level of A/MS devices. The 1stpresentation will discuss how to increase the observed return rates of Automotive ICs to 10ppb but at the same time as removing the costly burn in stage.