Trends & Challenges in Today's Automotive SOCs
Y. Zorian · 2019
Given today's fast growing automotive semiconductor industry, this keynote will discuss its implications on automotive quality, reliability, functional safety and security in all aspects of the SOC lifecycle. The SOC lifecycle includes design, silicon bring-up, volume production, and particularly in-system reliability. Today's automotive safety critical chips need multiple in-system robustness modes, such as key-on and key-off test and repair, periodic in-field self-test during mission mode, advanced error correction solutions, security authentication, and functional safety. The keynote will also discuss these in-system robustness modes and the show the benefits of meeting the ISO 26262 standard.