Study of Jtag-Tap Controller for Board Level Testing
V. Jayapradha · Zenodo (CERN European Organization for Nuclear Research) · 2018
This paper gives the detailed study of Test Access Port (TAP) and its functions associated with boundary scan testing for various Unit under Test (UUT).It also explain the boundary scan instructions and the signals through the TAP controller. Supports the applications of testing the devices on various factor using JTAG standard.