Adapting Layer RBERs Variations of 3D Flash Memories via Multi-granularity Progressive LDPC Reading
Yajuan Du, Yao Zhou, Meng Zhang, Wei Liu, Shengwu Xiong · 2019
Existing studies have uncovered that there exist significant Raw Bit Error Rates (RBERs) variations among different layers of 3D flash memories due to manufacture process variation. These RBER variations would cause significantly diversed read latencies when reading data with traditional Low-Density Parity-Check (LDPC) codes designed for planar flash memories, which induces sub-optimal read performance of flash-based Solid-State Drives (SSDs).