Experience with the IBM Sub-Angstrom STEM
Philip E. Batson · Microscopy and Microanalysis · 2003
After installation of the Nion spherical aberration corrector in the IBM 120kV VG Microscopes HB501 STEM, it has been apparent that the probe size has become about 0.78 Å, somewhat smaller than expected.[1,2] While this is a welcome outcome, it does present difficulties in understanding, particularly given that we have identified some very real issues relating to interpretation of the results.[3]