A Synchronous Trigger Method of Parallel Tasks Suitable for Semiconductor Testing
Tao Yan, Xiucai Zhao, Wenan He, Jichao Miao · Journal of Physics Conference Series · 2019
With the rapid development of semiconductor chip technology, the role of parallel testing in the semiconductor testing is increasing. Aiming at the uncontrollable trigger delay caused by the test task startup delay, this paper proposes a parallel task synchronization trigger method for semiconductor testing. The LabWindows/CVI integrated development environment is used to implement the design and development. The method achieves the test task starting delay time stable and not subject to parallel number affects, then ensure the efficiency and stability of parallel testing.