Precision CMOS receivers for VLSI testing applications
D. Weinlader, Thomas H. Lee, James A. Gasbarro · 2001
Testing CMOS parts is becoming more difficult due to the proliferation of high-speed I/O circuits that operate at frequencies exceeding the performance capabilities of modern testers. The performance gap between high-speed chip I/O frequencies and tester frequencies is further extended by the rapid performance scaling of CMOS, compared to bipolar and GaAs technologies which are commonly used in tester electronics.