Characterization of 1 Ω, 10 Ω and 1 kΩ Metal-Foil Standard Resistors
Takayuki Abe, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu‐Hisa Kaneko · 2018
We have been developing and evaluating metal-foil standard resistors manufactured based on the Stress Free Bulk Metal Foil technology. This paper describes drift characterization of 1 kΩ standard resistors and continuing long-term drift characterization of 1 Ω, 10 Ω standard resistors. We found that all resistors show extremely small drift rates., e.g., 5 nΩ/(Ω year) for 1 kΩ standard resistors.