Testing Microcontroller Based Physical Systems Using Finite Transition Models
Andrey V. Laputenko, Timofey D. Petukhov, Nikolai A. Vasnev · 2018
Many devices of controlling parts of physical systems are implemented on the basis of microcontrollers. Such critical systems are needed to be tested thoroughly. This paper contains experimental results on testing controlling parts of laser based physical systems. We consider generators of synchronizing pulses for controlling important parts of the laser system. Test derivation is performed using the model of a timed transition system with finite number of states. We then generate a number of mutants for a microcontroller part and the performed experiments clearly show that timed Finite State Machine based test suites have a good quality as they allow to detect most frequently occurring faults in considered systems.