Low Power Optimization Technique Based Linear Feedback Shift Register
Singh Dharmendra, Singh Ankit, AGRAWAL PRACHI, AGRAWAL HARSHITA · i-manager s Journal on Circuits and Systems · 2018
In Very-Large-Scale Integration (VLSI), the main challenges for the researchers are to reduce the power dissipation by the devices. In this paper, the authors have proposed a modified version of the Linear Feedback Shift Register to meet the specific output. The power consumption can be reduced by deactivating the clock signal from the flip flop to design test pattern generator during testing power. The LFSR pseudo-random test pattern generator is used in the testing of the ASIC chips, which is used to generate the random sequences of the desired pattern generator. This paper will help in the reduction of additional test inputs used for the ASIC. The test pattern is generated in such a way that the component requirements can be reduced.