Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM)

Subagaran Letchumanan, Terrence Huat Hin Tan, Yee Pheng Gan, Sai Leong. Wong · 2018

As monolithic SOCs keep adding more and more IPs, the resultant test cost to augment overall coverage to be within committed outgoing defect parts per million (DPPM) becomes a challenge. The reliance on system-level testing (SLT) for additional coverage to keep outgoing DPPM within acceptable level is now becoming a norm. The challenge is always on how to keep SLT within a minimal test time budget to keep test cost low. This paper explains how an adaptive test method was successfully implemented on a SLT platform which intelligently applies different test contents per part based on its DPPM risk tag.

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