DOST: Dynamically obfuscated wrapper for split test against IC piracy
Xiaoxiao Wang, Yueyu Guo, Tauhid Ramhan, Dongrong Zhang, Mark Mohammad Tehranipoor · 2017
With the horizontal model for the modern IC supply chain, IC piracy may take place at untrusted foundry and assembly, by overproducing, shipping out-of-spec/defective devices, or reverse engineering. To protect IC design house from revenue loss, in this paper, a novel dynamically obfuscated wrapper for the secure split test (DOST) is presented, which enables IC design house to fully control the production test and authentication process. DOST has been implemented on benchmarks including VGA-LCD, FGU, Leon3, and Leon3mp. By conducting structural tests in locked mode and functional tests in temporarily unlocked mode, DOST facilitates both types of tests. Experimental results demonstrate that DOST is capable of eliminating potential IC piracy risks, with an average area and shifting power overhead limited to 1.381% and 1.276%, respectively.