On-Line Analysis of Stuck-at Faults in On-Chip Network Interconnects
Biswajit R. Bhowmik, Jatindra Kumar Deka, Santosh Biswas · Journal of Circuits Systems and Computers · 2018
Reliability has become a major concern when link-wires in on-chip networks (NoCs) suffer from stuck-at faults (SAFs). This paper presents an extended and scalable test scheme that addresses these faults in NoC links to improve yield and reliability. The scheme detects the stuck-at faults on and identifies faulty link-wires. Experiments demonstrate the effectiveness of the proposed scheme and reveal deep insights of the faults on several performance metrics.