ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits
Anthony Coyette, Baris Esen, Nektar Xama, Georges E. Gielen, Wim Dobbelaere, Ronny Vanhooren · IEEE Design and Test · 2018
This paper presents an integrated workflow for design-for-test and test signal generation of mixed-signal circuits. The DfT phase pre-partitions the core under test and allows an efficient automatic generation of test signals.