Summary of NIST latent fingerprint testing workshop
Vladimir N. Dvornychenko, Michael D. Garris · 2006
The central focus of this paper is on the Latent Testing Workshop, held on the National Institute of Standards and Technology (NIST) Campus April 5 to 6, 2006 and the lessons that were learned from it.The primary goal of the workshop was to gather information for the creation of a "Latent Challenge," whose purpose is to stimulate Latent Automated Fingerprint Identification System (AFIS) vendors to submit their AFIS prototype systems for evaluation.To lay the foundations for such testing it is necessary that: 1) suitable test sets be identified and prepared; 2) the Application Programming Interface (API) is defined; and 3) the effective methods of performance scoring be defined.To provide background and context, past and present latent fingerprint activity at NIST is discussed.While the primary focus is on latent fingerprints, the paper also surveys relevant general biometrics activity.