Automotive Functional Safety Assurance by POST with Sequential Observation
Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima · IEEE Design and Test · 2018
Power-on self-test is an efficient means for covering safety-critical faults in automotive systems. This paper presents a multicycle logic BIST technique that avoids fault masking after multiple cycles by sequential observation using a new scan cell structure. -Hans-Joachim Wunderlich, Universität Stuttgart