Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing
Afaq Ahmad · 2017
Convergence of electronics, semiconductor systems and computing are rapidly transforming society at much faster pace than incorporation fault-tolerance and test methodologies in the systems. Further, underlying hardware and software in communication, security, quality of life, health, economic or financial well-being systems are increasingly being used for making decisions that influence individual and society. Consequently, it is imperative that the underlying hardware and software perform correctly and be defect free. However, to achieve zero defect through testing, screening and incorporation of redundancies is extremely challenging. This is what exactly the theme of my talk. During my presentation I will touch upon the mechanisms and issues to cope with the challenges.