A method to estimate cross-section of circuits at RTL levels
Liyi Xiao, Anlong Li, Xuebing Cao, Hongchen Li, Rongsheng Zhang, Jie Li, Tianqi Wang · 2017
This paper proposed a method to estimate cross-section of circuits at RTL level design. By combination of the intrinsic cross-section which was obtain from Monte-Carlo simulation with the results obtained from fault injection, the method can provide systematic dynamic cross-section of the design. It can be an alternative method instead of ground radiation test to get cross section. The DDC IP Core has been simulated for test. The results showed that dynamic cross-section is smaller than static cross-section in certain application. The saturated dynamic cross-section of it is about 5e-3 cm2/device.