A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification
Gang Li, Pengjun Wang, Yuejun Zhang · 2017
In this paper a highly reliable lightweight PUF scheme is proposed, which is based on current reference source and the deviation of current mirrors. When configuring the deviation current source by applying n input challenges, the PUF circuit can generate 2nindependent output secret keys correspondingly. Post-layout simulation results show a worst case reliability of 99.27% over the extended temperature range of 40°C to 120°C and 10% fluctuations in supply voltage, indicating a high reliability and effectiveness for secure chip identification.