DC MUX PUF: A highly reliable feed-back MUX PUF based on measuring duty cycle
Yunhao Xu, Yingjie Lao, Weiqiang Liu, Xiaohu You, Chuan Zhang · 2017
Ring oscillator physical unclonable function (RO PUF) and multiplexer physical unclonable function (MUX PUF) are the two mostly used structures that make use of gate delay, but their reliability is not satisfactory enough. In this paper, a new structure, duty cycle multiplexer physical unclonable function (DC MUX PUF) is proposed to improve the reliability. A feed-back structure is added to original MUX PUF and decision method is also changed by measuring duty cycle. Then a simplified model is built to calculate the reliability of DC MUX PUF, a primary Monte Carlo simulation with this model is accomplished. The reliability of DC MUX PUF and the original MUX PUF are compared, and it is suggested that DC MUX PUF performs better than original MUX PUF considering noise variation. Then temperature variation is considered, and simulated by HSPICE. It is suggested that reliability of them are both above 95% when temperature varies. Uniqueness and randomness are all more than 90%. Then the complexity of two kinds of PUF are also taken into consideration. When challenge length becomes long, complexity of this design is relatively lower than original MUX PUF.