Use models for extending IEEE 1687 to analog test
Peter Sarson, Jeff Rearick · 2017
Through four use cases with examples, we describe how IEEE 1687 can be extended to include analog and mixed-signal chips, including linkage to circuit simulators on one end of the ecosystem and ATE on the other. The role of instrumentation, whether on the tester or on the device itself, is central to analog testing, and conveniently also the focal point of IEEE 1687. We identify enhancements to the modular netlist and test languages (ICL and PDL) to facilitate the description of the components involved in analog tests as well as the content of the tests themselves.