On applying scan based structural test for designs with dual-edge triggered flip-flops
Xijiang Lin · 2017
In order to reduce the power consumption and improve the circuit performance, the dual-edge triggered flip-flop (DETFF) has been using as sequential element in the designs. Comparing with conventional single-edge triggered flip-flop (SETFF), applying the scan based structural test for the designs using DETFFs faces additional challenges. In this paper, we address some of the challenges, including a non-intrusive design of the scan DETFF, ATPG models of the scan DETFF, and several test generation issues, in order to achieve highest structural test quality for such kind of designs. The test generation results on modified ISCAS-89 and ITC-99 designs demonstrate the effectiveness of the proposed strategies.