An Empirical Set of Metrics for Embedded Systems Testing
Alfonso Alongi, Giuseppe Vitello, Salvatore Vitabile, Vincenzo Conti · IEEE Design and Test · 2017
Selecting the right platform for an embedded system is a challenging task, because there are no systematic methodologies for comprehensive evaluation and comparison of competing alternatives. This article partially addresses this problem by formulating a set of relevant metrics and an evaluation methodology. By applying their concepts to the evaluation of two alternative platforms, the Raspberry Pi3 and the Intel Edison boards, the authors demonstrate the utility of their approach and show under which objectives one is preferable over the other.—Axel Jantsch, TU Wien