Disk failure prediction model for storage systems based on disk SMART technology
Yin Yang, Wenyi Li, Manning Zhang, Xiaomei Ding, Jing Dai · International Journal of Computers and Applications · 2015
Recent years have seen remarkable advancements in storage systems designed to carry data. The data reliability issue has become increasingly important, as certain adverse factors can impact storage systems and cause data loss. In this study, we developed a disk failure prediction model using disk SMART technology for disk-based storage systems. The proposed model works in a twofold process: first, a parameter reliability model is established based on the actual threshold and attribute values of the SMART parameters, (which we determined through theoretical discussion, then experimentation and analysis) and second, a disk reliability model is built according to the parameter reliability model and parameter weights as determined. The disk reliability failure threshold is then determined by analyzing the SMART parameter data and parameter weights in tandem with the disk reliability model to fully determine the level of disk reliability. This approach eventually allows the user to migrate low-level reliability disks to backup disks, thereby improving the overall reliability of the storage system. Experimental results proved that the proposed approach is feasible and effective.