Comparison of on-chip ADC testing techniques
A. Yu. Egorov, I. A. Mozhaev, Pavel V. Nekrasov, Dmitry V. Boychenko, Ilya O. Loskutov · 2017
In this paper some popular techniques of analog-to-digital converter parameters measurement are compared. The structure of the proposed software-hardware complex and experiment procedure are described. Experimental results are presented.