Distance scaling of electric-field noise in a surface-electrode ion trap
Jonathon A. Sedlacek, Alex Greene, Jules Stuart, Robert McConnell, Colin Bruzewicz, Jeremy Sage, John Chiaverini · Physical Review A · 2018
The electric-field noise affecting quantum logic gates in surface-electrode ion traps is studied as a function of trapping frequency, electrode temperature, and distance $d$ between ion and surface. The finding that the noise scales as $1/{d}^{4}$ eliminates various surface-noise models that have been proposed to explain the anomalous ion heating observed in this type of trap.