Imperative improvement from failure mode effect analysis to action mode effect, inference, and yield analysis of miss-over-orders
Makoto Katoh, Natsuki Imura, Kouto Washio · 2017
This paper presents, from `failure mode effect analysis (FMEA)' to `action mode effect, inference, and yield analysis (AMEIYA)' for compound miss-over-orders (MOOs), by which sentences are rearranged for the purpose of imperative improvement. Then it proposes an extended sequential functional chart (SFC) description. It facilitates useful AMEIYA classifications for contradictory orders as an example. The purpose of the present study is to start from the MOO classification in the dependency analysis of a compound order in an effort to reduce misunderstandings in MOOs generated during such instruction translations, even if slightly, and to establish detection and correction plans.