Efficient computation of the sensitization probability of a critical path considering process variations and path correlation
Pavan Kumar Javvaji, Spyros Tragoudas · 2017
The problem of determining the sensitization probability of a path by a test vector is investigated. It is important when testing for delay defects due to process variations. An algorithm is presented which has high accuracy. Gate delays are modeled as probability mass functions, and novel operations are introduced that take into consideration circuit reconvergences and path correlations. Experimental results and comparisons with Monte Carlo are presented on the ISCAS'85, ISCAS'89 and ITC'99 benchmarks.