Diagnosis with transition faults on embedded segments
Theodoros Toulas, Spyros Tragoudas · 2017
A method is presented that guides diagnosis using multiple transition faults on sensitized embedded segments. Suspect faults are eliminated with non-enumerative operations and non-pruned faults are ranked. The approach also considers speed-ups on gates. Experimental results demonstrate the scalability of the proposed approach and its effectiveness in fault diagnosis.