Trojan circuits preventing and masking in sequential circuits
Anzhela Yu. Matrosova, E. Mitrofanov, S. Ostanin, I. Kirienko · 2017
The following topics are dealt with: integrated circuit reliability; integrated circuit testing; integrated circuit design; SRAM chips; logic design; radiation hardening (electronics); field programmable gate arrays; system-on-chip; probability; and fault tolerance.