Test pattern generation for multiple stuck-at faults not covered by test patterns for single faults
Conrad Jinyong Moore, Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita · 2017
Previous works have shown that given an initial set of test patterns for single faults, relatively few additional tests are required to cover all multiple faults. In this paper, the exact situations in which the test patterns for single stuck-at faults do not detect multiple stuck-at faults are examined. We present proofs which show the conditions that is required to be met for ATPG on single faults to cover all multiple faults. Based on this analysis, we propose a new incremental ATPG method which first targets only single faults and then incrementally expands it to multiple faults with larger cardinalities, and present the experimental results for double faults.