A new approach for diagnosing bridging faults in logic designs
Amir Masoud Gharehbaghi, Masahiro Fujita · 2017
As fabricated chips get larger and denser, more kinds of defects happen that cannot be explained by the traditional stuck-at-fault model. In this paper, we propose a new approach for diagnosis of bridging faults based on analysis of the logic design. The proposed approach is based on iteratively solving SAT problems until finding the internal signals that can explain the misbehavior of the circuit caused by bridging faults. Our experiments on ISCAS circuits shows efficiency and effectiveness of our method.