Plenoptic background oriented schlieren imaging
Jenna N. Klemkowsky, Timothy W. Fahringer, Christopher J. Clifford, Brett F. Bathel, Brian S. Thurow · Measurement Science and Technology · 2017
Abstract The combination of the background oriented schlieren (BOS) technique with the unique imaging capabilities of a plenoptic camera, termed plenoptic BOS, is introduced as a new addition to the family of schlieren techniques. Compared to conventional single camera BOS, plenoptic BOS is capable of sampling multiple lines-of-sight simultaneously. Displacements from each line-of-sight are collectively used to build a four-dimensional displacement field, which is a vector function structured similarly to the original light field captured in a raw plenoptic image. The displacement field is used to render focused BOS images, which qualitatively are narrow depth of field slices of the density gradient field. Unlike focused schlieren methods that require manually changing the focal plane during data collection, plenoptic BOS synthetically changes the focal plane position during post-processing, such that all focal planes are captured in a single snapshot. Through two different experiments, this work demonstrates that plenoptic BOS is capable of isolating narrow depth of field features, qualitatively inferring depth, and quantitatively estimating the location of disturbances in 3D space. Such results motivate future work to transition this single-camera technique towards quantitative reconstructions of 3D density fields.