Challenges and Trends in Modern SoC Design Verification
Wen Chen, Sandip Kumar Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang · IEEE Design and Test · 2017
This paper provides a tutorial overview of the state-of-the-art in verification of complex and heterogeneous Systems-on-Chip. The authors discuss current industrial trends and key research challenges.